M2 AOI

The M2 offers high-speed microelectronic device inspection with exceptional defect coverage. With resolutions down to submircon levels and telecentric optics, the M2 provides complete inspection, all within a footprint less than 1 sq. meter.

Automated Optical Inspection for Microelectronics

Megapixel color imaging
High magnification
top-down viewing camera
Quick set-up
High speed
High defect coverage
Low false failure rate